Semiconductor device

Electrical transmission or interconnection systems – Switching systems – Condition responsive

Reexamination Certificate

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Details

C324S512000, C324S537000

Reexamination Certificate

active

07816816

ABSTRACT:
A plurality of circuit blocks are provided in a semiconductor device which collects and corrects impairment quantities of discretionary areas in a circuit group of various types having random couplings. The semiconductor device is provided with a detector, which is arranged in each circuit block and detects an electric signal of an element in the circuit block; a wiring wherein each detector output passes through; a plurality of switches for feeding the wiring with each detector output; and a buffer connected to the wiring and passes through a direct current voltage.

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patent: 6509197 (2003-01-01), Satya et al.
patent: 6658612 (2003-12-01), Park et al.
patent: 7061305 (2006-06-01), Kim
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patent: 2004-20325 (2004-01-01), None
patent: 2004-228836 (2004-08-01), None
patent: 2004-241101 (2004-08-01), None
patent: 2005-20119 (2005-01-01), None
5.15-5.825-ghZ 0.18-um CMOS RRANSCIEVER for 802.11a wireless LAN, IEEE JSSC, vol. 38, No. 12, 2003, pp. 2221-2231.
Wireless communication of the 1G-bps class in the IEEE 802.15 TG3a.

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