Static information storage and retrieval – Floating gate
Reexamination Certificate
2007-05-02
2009-11-24
Luu, Pho M (Department: 2824)
Static information storage and retrieval
Floating gate
C365S185260, C365S185280, C365S185290, C257S316000
Reexamination Certificate
active
07623371
ABSTRACT:
p-type wells are provided within an n-type embedded well of a semiconductor substrate lying in an area for forming a flash memory, in a state of being isolated from one another. A capacitance section, a data write/erase charge injection/discharge section and a data read MIS•FET are disposed in each of the p-type wells. The capacitance section is disposed between the data write/erase charge injection/discharge section and the data read MIS•FET. In the data write/erase charge injection/discharge section, writing and erasing of data by an FN tunnel current at a channel entire surface are performed.
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Oka Yasushi
Shiba Kazuyoshi
Le Toan
Luu Pho M
Miles & Stockbridge P.C.
Renesas Technology Corp.
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