Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Wire contact – lead – or bond

Reexamination Certificate

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C257S786000

Reexamination Certificate

active

07485972

ABSTRACT:
Provided is a semiconductor device which includes a conductive bonding pad formed on a semiconductor substrate of the first conduction type via an insulating film and a diffusion layer of the second conduction type formed on a surface of the semiconductor substrate under the bonding pad. Characteristics do not deteriorate even when a breakdown occurs during wire bonding.

REFERENCES:
patent: 3787717 (1974-01-01), Fischer et al.
patent: 4636832 (1987-01-01), Abe et al.
patent: 5272371 (1993-12-01), Bishop et al.
patent: 5751065 (1998-05-01), Chittipeddi et al.
patent: 5986343 (1999-11-01), Chittipeddi et al.
patent: 6187658 (2001-02-01), Chittipeddi et al.
patent: 6448641 (2002-09-01), Ker et al.
patent: 6509625 (2003-01-01), Casey
patent: 6633087 (2003-10-01), Ker et al.
patent: 6864562 (2005-03-01), Toyosawa et al.
patent: 6995084 (2006-02-01), Srivastava et al.
patent: 63283138 (1988-11-01), None
patent: 03-070181 (1991-03-01), None
patent: 09-289304 (1997-11-01), None
patent: 2001-015547 (2001-01-01), None

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