Measuring and testing – Fluid pressure gauge – Electrical
Reexamination Certificate
2008-02-11
2009-10-27
Allen, Andre J (Department: 2855)
Measuring and testing
Fluid pressure gauge
Electrical
C361S283400, C257S704000
Reexamination Certificate
active
07607355
ABSTRACT:
A semiconductor device is equipped with a semiconductor sensor chip for detecting pressure variations that is arranged inside of a hollow cavity of a housing, wherein an opening is formed in a prescribed region of the housing, which is not positioned opposite to the semiconductor sensor chip, so as to allow the hollow cavity to communicate with an external space. The opening is formed using at least one through-hole having a thin slit-like shape. Alternatively, the opening is formed using plural through-holes each having a desired shape such as a thin slit-like shape, a circular shape, and a sectorial shape. Thus, it is possible to reduce negative influences due to environmental factors such as dust and sunlight with respect to the semiconductor sensor chip.
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Office Action issued May 26, 2009, on the counterpart Korean Patent Application No. Oct. 2008-0013121 and partial English translation thereof.
Shirasaka Kenichi
Suzuki Yukitoshi
Allen Andre J
Pillsbury Winthrop Shaw & Pittman LLP
Yamaha Corporation
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