Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means

Reexamination Certificate

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C257SE21546

Reexamination Certificate

active

07605442

ABSTRACT:
A semiconductor device comprises a semiconductor substrate, a plurality of transistors provided in the semiconductor substrate, and an isolation region for isolating the plurality of transistors to one another, the isolation region being comprised of an isolating insulation film, wherein a crystal structure of at least a part of the isolating insulation film is broken.

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patent: 2003-272306 (2003-09-01), None
A. Shimizu et al., “Local Mechanical-Stress Control (LMC): A New Technique for CMOS-Performance Enhancement”, International Electron Devices Meeting, Technology Digest, 2001, pp. 19.4.1-19.4.4.
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S. Ito et al, “Mechanical Stress Effect of Etch-Stop Nitride and its Impact on Deep Submicron Transistor Design”, International Electron Devices Meeting, Technology Digest, 2000, pp. 10.7.1-10.7.4.

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