Semiconductor device

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07489486

ABSTRACT:
A semiconductor device includes at least a plurality of first interface circuits electrically coupled between first and second power supply lines belonging to a first power supply system, one or more first circuits including a first surge current path coupled to the first power supply line and a second surge current path coupled to the second power supply line, a plurality of second interface circuits electrically coupled between third and fourth power supply lines belonging to a second power supply system independent from the first power supply system, and further electrically coupled to a corresponding interface circuit of the plurality of first interface circuits, respectively, and one or more second circuits including a third surge current path coupled to the first circuit and have a first time constant derived by a first resistance coupled to the third surge current path and a first capacitance.

REFERENCES:
patent: 5886558 (1999-03-01), Iijima et al.
patent: 6747857 (2004-06-01), Lee et al.
patent: 7076757 (2006-07-01), Hirata
patent: 2005/0180073 (2005-08-01), Amer et al.
patent: 2007/0097568 (2007-05-01), Miske
patent: 2008/0175045 (2008-07-01), Lin

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4064968

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.