Semiconductor device

Details Semiconductor device Semiconductor device

2007-08-14

2007-08-14

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11639278

ABSTRACT:
A power supply potential and a ground potential are supplied to a test-use power supply pad and a test-use ground pad, respectively. The power supply potential supplied to the test-use power supply pad is transferred to power supply lines and then to each circuit block via a test-use power supply line and a potential transfer circuit including a diode device. A voltage drop is caused by each of the diode devices. To cope with the voltage drop, however, respective sizes of the diode devices and resistance components of the potential transfer circuits are configured so that a uniform voltage drop is generated at each of the power supply lines.

REFERENCES:
patent: 5111059 (1992-05-01), Woodworth
patent: 5404099 (1995-04-01), Sahara
patent: 6351134 (2002-02-01), Leas et al.
patent: 6410936 (2002-06-01), Hongo
patent: 7193865 (2007-03-01), Balakrishnan et al.
patent: 2002/0191469 (2002-12-01), Honma et al.
patent: 2003/0219913 (2003-11-01), Pourkeramati et al.
patent: 2005/0067899 (2005-03-01), Kawanishi et al.
patent: 2005/0099862 (2005-05-01), Lunde

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