Active solid-state devices (e.g. – transistors – solid-state diode – Tunneling pn junction device
Reexamination Certificate
2006-08-01
2006-08-01
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Tunneling pn junction device
C257S347000, C257S046000, C257S212000
Reexamination Certificate
active
07084437
ABSTRACT:
Provided is an MRAM memory cell structure capable of preventing generation of parasitic transistors. Diodes are adopted as switching elements of an MRAM memory cell. An n-type semiconductor layer and a p-type semiconductor layer, which collectively constitute a diode, are formed on a surface semiconductor layer of an SOI substrate. The n-type semiconductor layer and the p-type semiconductor layer are disposed in a lateral direction and isolated by an isolation region, whereby the diode is isolated electrically from other elements and from the substrate.
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patent: 5793697 (1998-08-01), Scheuerlein
patent: 6097625 (2000-08-01), Scheuerlein
patent: 6567299 (2003-05-01), Kunikiyo et al.
patent: 6589180 (2003-07-01), Erikson et al.
patent: 6625057 (2003-09-01), Iwata
patent: 6741495 (2004-05-01), Kunikiyo et al.
Kitamura Kohji
Miyatake Hisatada
Sunaga Toshio
Abate Joseph P.
Nhu David
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