Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With large area flexible electrodes in press contact with...

Reexamination Certificate

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Details

C257S689000, C257S693000, C257S658000, C257S712000

Reexamination Certificate

active

07061090

ABSTRACT:
A semiconductor device comprises a semi-conductor chip bonded on a top surface inside a case electrode by a bonding material and a lead electrode bonded on a top surface of the semiconductor chip by a bonding material with a space of the case electrode filled with an insulating material for sealing the bonded sections, wherein a groove is provided on a top surface of the case electrode from an edge of the semiconductor chip, to thereby reduce heat distortion which is generated on a large scale at an end of the bonding material on account of a difference in coefficients of linear thermal expansion between the semiconductor chip and the case electrode and improve the thermal fatigue life.

REFERENCES:
patent: 5005069 (1991-04-01), Wasmer et al.
patent: 5886403 (1999-03-01), Yoshinaga et al.
patent: 4-229639 (1992-08-01), None
patent: 10-215552 (1998-08-01), None
patent: 11-243165 (1999-09-01), None

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