Semiconductor composite element, and method of detecting abnorma

Details Semiconductor composite element, and method of detecting abnorma Semiconductor composite element, and method of detecting abnorma

1996-12-18

1999-02-09

Wells, Kenneth B.

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

327172, 327268, 361 93, 34082516, H01L 3500

Patent

active

058699961

ABSTRACT:
A semiconductor composite element in which abnormal conditions of overcurrent, control supply voltage reduction and overheat are detected, and different abnormality signals are outputted according to the respective abnormal conditions thus detected. The semiconductor composite element includes: abnormal condition detecting circuitry for detecting the overcurrent and control supply voltage reduction of any one or all of the plurality of semiconductor switching elements and the overheat of the semiconductor composite element. An abnormality signal generating circuit is provided for producing different abnormality signals according to the respective abnormal conditions detected by the abnormal condition detecting circuitry.

REFERENCES:
patent: 3646398 (1972-02-01), Kotos
patent: 4052659 (1977-10-01), Fletcher et al.
patent: 4572143 (1986-02-01), Umesaki et al.
patent: 4845483 (1989-07-01), Negishi
patent: 4931751 (1990-06-01), Keller et al.
patent: 5426390 (1995-06-01), Yabe et al.

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