Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-01-09
2007-01-09
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S765010, C374S183000
Reexamination Certificate
active
11090292
ABSTRACT:
The invention involves a process for heating a semi-conductor component, as well as a semi-conductor component, whereby a device for heating the semi-conductor component is provided on the semi-conductor component.
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Eggers Georg
Huber Thomas
Menck Peggy
Chan Emily Y
Infineon - Technologies AG
Morrison & Foerster / LLP
Nguyen Vinh
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