Semiconductor component with conductors at different levels

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular power supply distribution means

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Details

257208, 257211, 257401, 257758, H01L 2710

Patent

active

056252072

DESCRIPTION:

BRIEF SUMMARY
BACKGROUND OF THE INVENTION

This invention relates to a semiconductor component having at least a first and a second component electrode and comprising a plurality of semiconductor elements which are integrated in a semiconductor chip and which each include at least a first and a second element electrode provided on the same side of the semiconductor chip, the first element electrodes being connected to the first component electrode, and the second element electrodes being connected to the second component electrode.
When controlling electrical power, the forward resistance of the control elements should be as low as possible. Combining a high breakdown voltage and a low forward resistance, thyristors are often used as control elements. However, thyristors have a forward voltage drop of about 1 volt, which is a disadvantage. Consequently, thyristors are less suitable for controlling electrical power at low voltages.
Transistors, which have a lower forward voltage drop or none at all, may instead be used. Normally, transistors for high currents have their source and their drain arranged on either side of the semiconductor chip in which they are made. As a result, the forward resistance of such transistors at least equals the resistance through the semiconductor chip. The forward resistance caused by the semiconductor chip can be reduced by arranging the drain and the source on the same side of the semiconductor chip. However, the forward resistance will nevertheless be high when controlling high currents. The reason for this will be explained below.
When used for controlling high currents, a large number of transistors have to be connected in parallel. The greater the number of transistors that can be arranged on a given surface of a semiconductor chip, the higher the currents that can be directed through this surface. Since transistor density may today exceed 100,000 transistors per cm.sup.2 it will be appreciated that contacting has to involve conductors of minute dimensions if it is to be possible to contact the sources and the drains on the same side of the semiconductor chip. However, minute conductors will have a considerable resistance, which, in turn, leads to a high forward resistance of the transistor component formed by the paralleled transistors.
EP 0 218 529 discloses a field-effect transistor composed of a large number Of field-effect-transistor elements integrated in a semiconductor chip. Each transistor element has a source area, a drain area and a gate area. The source and drain areas are arranged in a checkered pattern. Across the semiconductor chip extend diagonally parallel conductors alternately connecting the source and drain areas to a common source electrode and a common drain electrode, respectively, the common electrodes being arranged adjacent to the source and drain areas. The diagonal conductors are arranged on two levels, the conductors most distant from the semiconductor chip extending across most of the conductors closest to the semiconductor chip and being spaced apart therefrom by a dielectric layer through which contacts extend. Such an arrangement on different levels reduces current density and resistance without there being any need of increasing the width of the conductors. However, the forward resistance is nevertheless high, the average distance between the individual transistor elements and the common electrodes being considerable.


SUMMARY OF THE INVENTION

One object of the present invention is to provide a semiconductor component of lower forward resistance than known semiconductor components of similar type.
Another object of the invention is to provide a semiconductor component suited for controlling high currents and having a lower forward voltage drop than known semiconductor components for controlling high currents.
A further object of the invention is to provide a semiconductor component for controlling high currents, enabling higher current densities than known components of similar type.
The element electrodes of the semiconductor component being arrange

REFERENCES:
patent: 3801880 (1974-04-01), Harda et al.
patent: 4984061 (1991-01-01), Matsumoto
patent: 5027188 (1991-06-01), Owada et al.
patent: 5309015 (1994-05-01), Kuwata et al.
patent: 5391921 (1995-02-01), Kudoh et al.
patent: 5488238 (1996-01-01), Enraku et al.
Schuster, "VMOS Logic with Two Levels of Wiring," IBM Technical Disclosure Bulletin, vol. 22, No. 3, Aug. 1979, pp. 1284-1285.

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