Semiconductor component test apparatus including sucking mechani

Details Semiconductor component test apparatus including sucking mechani Semiconductor component test apparatus including sucking mechani

1997-02-13

2000-08-29

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3102

Patent

active

061114170

ABSTRACT:
A semiconductor test system comprises a tray including a plurality of pockets for accommodating a plurality of semiconductor component parts, a sucking mechanism for sucking the semiconductor component parts to firmly maintain the semiconductor component parts in the tray and a mechanism for moving the tray of semiconductor component parts relative to the sucking mechanism.

REFERENCES:
patent: 4778326 (1988-10-01), Althouse et al.
patent: 4869636 (1989-09-01), Reid et al.
patent: 5027063 (1991-06-01), Letourneau
patent: 5227717 (1993-07-01), Tsurishima et al.
patent: 5575610 (1996-11-01), Soyama
patent: 5596282 (1997-01-01), Giddings et al.

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