Semiconductor component having dummy segments with trapped...

Active solid-state devices (e.g. – transistors – solid-state diode – Encapsulated

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE23043, C257SE21504, C257SE23125, C257SE23004, C257S788000, C257S667000, C257S687000, C264S272170, C264S316000, C264S272150, C425S544000, C425S572000, C425S588000, C425S116000, C425S089000, C425S394000, C425S117000, C438S127000, C438S123000

Reexamination Certificate

active

10949904

ABSTRACT:
A semiconductor component includes a leadframe, a die, upper and lower body segments encapsulating the die, and dummy segments on the leadframe. The dummy segments are configured to vent trapped air in a molding compound during molding of the body segments, such that corners of the body segments do not include the trapped air.

REFERENCES:
patent: 4556896 (1985-12-01), Meddles
patent: 5550711 (1996-08-01), Burns et al.
patent: 5578261 (1996-11-01), Manzione et al.
patent: 5623163 (1997-04-01), Izumi
patent: 5665281 (1997-09-01), Drummond
patent: 5757067 (1998-05-01), Inaba
patent: 5776512 (1998-07-01), Weber
patent: 5824252 (1998-10-01), Miyajima
patent: 5853771 (1998-12-01), Matsumoto
patent: 5971734 (1999-10-01), Moon
patent: 6210992 (2001-04-01), Tandy et al.
patent: 6229202 (2001-05-01), Corisis
patent: 6258624 (2001-07-01), Corisis
patent: 6309916 (2001-10-01), Crowley et al.
patent: 6329829 (2001-12-01), Farnworth et al.
patent: 6331453 (2001-12-01), Bolken et al.
patent: 6373126 (2002-04-01), Patel et al.
patent: 6383846 (2002-05-01), Shen et al.
patent: 6424023 (2002-07-01), Kim et al.
patent: 6439869 (2002-08-01), Seng et al.
patent: 6521980 (2003-02-01), Tandy et al.
patent: 6523254 (2003-02-01), Street et al.
patent: 6537051 (2003-03-01), Tandy
patent: 6626656 (2003-09-01), Thummel
patent: 6638595 (2003-10-01), Rumsey et al.
patent: 6644949 (2003-11-01), Rumsey et al.
patent: 6645792 (2003-11-01), Oga et al.
patent: 6652799 (2003-11-01), Seng et al.
patent: 6656769 (2003-12-01), Lee et al.
patent: 6660558 (2003-12-01), Bolken et al.
patent: 6670220 (2003-12-01), Sakuraba et al.
patent: 6724072 (2004-04-01), Ochiai et al.
patent: 6773247 (2004-08-01), Osada et al.
patent: 6800507 (2004-10-01), Kasuga et al.
patent: 6969918 (2005-11-01), James et al.
patent: 7005025 (2006-02-01), Summers
patent: 2002/0012716 (2002-01-01), Mishima et al.
patent: 2002/0024126 (2002-02-01), Hauser et al.
patent: 2002/0025353 (2002-02-01), Williams
patent: 2002/0033523 (2002-03-01), Cigada et al.
patent: 2002/0043389 (2002-04-01), Murugan
patent: 2002/0043721 (2002-04-01), Weber
patent: 2002/0051832 (2002-05-01), Abela et al.
patent: 2002/0057553 (2002-05-01), Jeon et al.
patent: 2002/0115237 (2002-08-01), Williams
patent: 2002/0186549 (2002-12-01), Bolken
patent: 2003/0034568 (2003-02-01), Chai et al.
patent: 2003/0122279 (2003-07-01), Tsuruta
patent: 2003/0178748 (2003-09-01), Bolken et al.
patent: 2004/0011699 (2004-01-01), Park
patent: 2004/0046267 (2004-03-01), Huang
patent: 2004/0150082 (2004-08-01), Kajiwara et al.
patent: 2005/0022378 (2005-02-01), Bolken et al.
patent: 2005/0133159 (2005-06-01), Johnsgard et al.
patent: 354043470 (1979-04-01), None
patent: 356002641 (1981-01-01), None
patent: 355022873 (1982-02-01), None
patent: 358017646 (1983-02-01), None
patent: 11-179763 (1999-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor component having dummy segments with trapped... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor component having dummy segments with trapped..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor component having dummy segments with trapped... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3776726

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.