Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Patent
1997-08-01
1999-10-05
Niebling, John F.
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
438112, 438118, 438127, 257676, H01L 2144, H01L 2148, H01L 2150, H01L 2166, G01R 3126
Patent
active
059637820
ABSTRACT:
A semiconductor component can be manufactured by providing a leadframe (12) with leads (13) and a flag (14) substantially coplanar with at least one of the leads (13) wherein the flag (14) has a hole (15). An electronic substrate (11) is adhered to the flag (14) wherein a perimeter of the electronic substrate (11) has bonding pads (21), wherein the bonding pads (21) face toward the flag (14), wherein the electronic substrate (11) covers the hole (15), and wherein the flag (14) is absent over the bonding pads (21). Next, the pads (21) are wire bonded to the leads (13), and then the electronic substrate (11) and the leadframe (12) are encapsulated with a packaging material (17) wherein the packaging material (17) has an opening (23) and is devoid of covering the hole (15) in the flag (14).
REFERENCES:
patent: 4699682 (1987-10-01), Takishima
patent: 4942454 (1990-07-01), Mori et al.
patent: 5570454 (1996-10-01), Liu
Machine Design, "Chemical Sensing Carves Out a Niche", vol. 69, No. 11, Jun. 5, 1997, p. 52.
Chen George C.
Jones Josetta
Motorola Inc.
Niebling John F.
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