Semiconductor color detector

Optics: measuring and testing – Refraction testing – Prism engaging specimen

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357 24, 358 48, G01J 346, H01L 2978, H04N 906

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active

039854493

ABSTRACT:
A system for detecting and analyzing the color of light impinging on a solid state imaging device or scanner. The scanner is composed of a triplet array of semiconductor photoelements with each photoelement in the array biased to act as a unique detector of a selected set of primary colors. Each photoelement is coupled to an photocurrent analyzing system which comprises a detection amplifier coupled to a trio of scaling amplifiers each of which in turn is coupled to a respective one of a trio of adder circuits. The output of each of these adder circuits is a signal indicative of the magnitude of a respective primary color impinging on the triplet array of photoelements.
Large area color scanning systems can be realized by using a plurality of such triplet photoelements and coupling these to a series of shift registers for sensing the current created in the photoelements by the different colors of light impinging on the photoelements and analyzing the current or charge outputs of the photoelements to determine the colors of the light falling on the photoelements.

REFERENCES:
patent: 3771149 (1973-11-01), Collins et al.
patent: 3858232 (1974-12-01), Boyle et al.
patent: 3860956 (1975-01-01), Kubo et al.

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