Semiconductor circuit

Details Semiconductor circuit Semiconductor circuit

1991-08-14

1992-05-05

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

307362, 324 731, 324158T, 371 221, G01R 3128

Patent

active

051111365

ABSTRACT:
A test mode input detection circuit for a semiconductor device comprises a first circuit including a group of transistors and a load element, the transistors and load element being connected in series between a power source and an input terminal, a node between the transistor group and the load element forming an output terminal of the first circuit; a second circuit including a transistor whose gate receives an output from the output terminal of the first circuit, and a transistor whose gate receives a power source voltage, these transistors being connected in series between the power source and a ground, a node between the transistors forming an output terminal of the second circuit; and an inverter circuit for providing a test mode signal in response to an output of the second circuit.

REFERENCES:
patent: 4398146 (1983-08-01), Draheim et al.
patent: 4550289 (1985-10-01), Kabashima et al.
patent: 4625310 (1986-11-01), Mercer
patent: 4733168 (1988-03-01), Blankenship et al.
patent: 4742486 (1988-05-01), Takamal et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4764924 (1988-08-01), Mate
patent: 4992727 (1991-02-01), Simpson et al.
patent: 5017809 (1991-05-01), Turner
patent: 5019772 (1991-05-01), Dreibelbis et al.

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