Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Beam leads
Patent
1998-12-16
2000-10-03
Williams, Alexander O.
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Beam leads
257691, 257 48, 257208, 257210, 257786, 257784, 257689, 257688, H01L 2348, H01L 2166
Patent
active
061277290
ABSTRACT:
A method of inspecting a chip with projecting electrodes or bumps, part of which are lacking, includes arranging electrode terminals for detecting projecting electrodes along four corners of a peripheral edge of a rectangular semiconductor chip, measuring an electrical characteristic of each of the electrode terminals, and determining the semiconductor chip as a defective one in terms of projecting electrodes if the measured result does not conform to a desired characteristic. As another feature, the surface of the projecting electrode of the electrode terminal is flattened.
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Mitsubishi Denki & Kabushiki Kaisha
Williams Alexander O.
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