Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing
Reexamination Certificate
2006-03-10
2009-12-15
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Substrate dicing
C438S409000, C438S460000, C438S693000, C438S704000, C438S751000
Reexamination Certificate
active
07632696
ABSTRACT:
A semiconductor chip including a semiconductor substrate provided with a semiconductor device region and a porous single crystal layer, where the semiconductor device region is formed on the main surface portion of the semiconductor substrate, and the porous single crystal layer is formed in an inner region on the backside of the semiconductor substrate, and is comprised of erosion holes extending continuously from the backside of the semiconductor substrate in an inward direction of the semiconductor substrate, oxide films formed on inner surfaces of the erosion holes, and a single crystal portion.
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Chinese Office Action (with English translation) issued in Chinese Patent Application No. CN 2006100547362, dated Mar. 7, 2008.
Hamada Koji
Kozuki Yasushi
Miyake Hideharu
Okonogi Kensuke
Oyu Kiyonori
Elpida Memory Inc.
McDermott Will & Emery LLP
Pham Thanh V
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