Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-06-19
2009-10-06
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
07598729
ABSTRACT:
A semiconductor chip flipping assembly and an apparatus for bonding a semiconductor chip using the same are disclosed. In accordance with the semiconductor chip flipping assembly and the apparatus for bonding a semiconductor chip using the same, a front surface of a wafer is mounted in a wafer holder to face downward. Each of dies of the wafer is then pushed downward to a tray disposed therebelow, thereby eliminating a need for a separate flipping process of the semiconductor chip and two or more robot arms.
REFERENCES:
patent: 3793714 (1974-02-01), Bylander
patent: 6311391 (2001-11-01), Fuke et al.
patent: 6872596 (2005-03-01), Waeckerle
Patel Paresh
Sigo Co., Ltd.
Sughrue & Mion, PLLC
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