Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2011-01-04
2011-01-04
Cao, Phat X (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S738000, C257SE23068
Reexamination Certificate
active
07863741
ABSTRACT:
A semiconductor chip formed with a bump such that the bump corresponds to a pad electrode. The pad electrode is covered with a nickel layer. The bump has an indium layer and an intermediate metal compound layer disposed between the indium layer and the nickel layer, and the intermediate metal compound layer is formed by alloying the indium layer and a copper layer containing copper atoms of not less than 0.5 atomic percent and not more than 5 atomic percent with respect to the indium atoms in the indium layer.
REFERENCES:
patent: 5131582 (1992-07-01), Kaplan et al.
patent: 6819002 (2004-11-01), Chen et al.
patent: 2006/0141671 (2006-06-01), Houle et al.
patent: 2697116 (1997-09-01), None
patent: 2000-349123 (2000-12-01), None
Ozaki Hiroshi
Wakiyama Satoru
Cao Phat X
Doan Nga
Rader & Fishman & Grauer, PLLC
Sony Corporation
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