Semiconductor burn-in thermal management system

Refrigeration – Structural installation – With electrical component cooling

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C062S121000, C062S310000, C062S171000, C165S080400

Reexamination Certificate

active

06857283

ABSTRACT:
A semiconductor burn-in thermal management system for providing an effective thermal management system capable of maintaining a desired semiconductor temperature during a burn-in cycle. The semiconductor burn-in thermal management system includes a reservoir for storing a volume of fluid, a pump fluidly connected to the reservoir, and a plurality of spray units fluidly connected to the pump. The spray units dispense the fluid upon the surface of the semiconductor during burn-in thereby maintaining a relatively constant surface temperature. Each of the spray units preferably includes a stationary first portion with a second portion movably positioned within the first portion in a biased manner. When burning in semiconductors without an integrated heat sink that are deeply recessed within the sockets of a burn-in board, the fluid pressure to the second portion is increased thereby extending the second portion from the first portion thereby reducing the effective distance from the surface of the semiconductor.

REFERENCES:
patent: 3589160 (1971-06-01), Gruver et al.
patent: 3915216 (1975-10-01), Fekete et al.
patent: 4056949 (1977-11-01), Hahn
patent: 4110999 (1978-09-01), Dvirka
patent: 4243441 (1981-01-01), Wilson
patent: 5105168 (1992-04-01), DaSilva
patent: 5220804 (1993-06-01), Tilton et al.
patent: 5314529 (1994-05-01), Tilton et al.
patent: 5359285 (1994-10-01), Hashinaga et al.
patent: 5380956 (1995-01-01), Loo et al.
patent: 5461328 (1995-10-01), Devereaux et al.
patent: 5515910 (1996-05-01), Hamilton et al.
patent: 5532610 (1996-07-01), Tsujide et al.
patent: 5541524 (1996-07-01), Tuckerman et al.
patent: 5579826 (1996-12-01), Hamilton et al.
patent: 5582235 (1996-12-01), Hamilton et al.
patent: 5701748 (1997-12-01), Phelps et al.
patent: 5713327 (1998-02-01), Tilton et al.
patent: 5718117 (1998-02-01), McDunn et al.
patent: 5797274 (1998-08-01), Jackaman et al.
patent: 5860602 (1999-01-01), Tilton et al.
patent: 5880931 (1999-03-01), Tilton et al.
patent: 5909123 (1999-06-01), Budnaitis
patent: 5933700 (1999-08-01), Tilton
patent: 5966022 (1999-10-01), Budnaitis et al.
patent: 5992159 (1999-11-01), Edwards et al.
patent: 6016969 (2000-01-01), Tilton et al.
patent: 6046060 (2000-04-01), Budnaitis
patent: 6104610 (2000-08-01), Tilton et al.
patent: 6108201 (2000-08-01), Tilton et al.
patent: 6114868 (2000-09-01), Nevill
patent: 6115251 (2000-09-01), Patel et al.
patent: 6175498 (2001-01-01), Conroy et al.
patent: 6181143 (2001-01-01), Ghoshal
patent: 6205799 (2001-03-01), Patel et al.
patent: 6288371 (2001-09-01), Hamilton et al.
patent: 6307388 (2001-10-01), Friedrich et al.
patent: 6317326 (2001-11-01), Vogel et al.
patent: 6320389 (2001-11-01), Tamesue et al.
patent: 6349554 (2002-02-01), Patel et al.
patent: 6354370 (2002-03-01), Miller et al.
patent: 6359456 (2002-03-01), Hembree et al.
patent: 6389225 (2002-05-01), Malinoski et al.
patent: 6421240 (2002-07-01), Patel
patent: 6484521 (2002-11-01), Patel et al.
patent: 6557622 (2003-05-01), Frank et al.
patent: 6604370 (2003-08-01), Bash et al.
patent: 6612120 (2003-09-01), Patel et al.
patent: 6644058 (2003-11-01), Bash et al.
patent: 20010002541 (2001-06-01), Patel et al.
patent: 20010050164 (2001-12-01), Wagner et al.
patent: 20020050144 (2002-05-01), Patel et al.
Spray Quench System for Directional Solidification Furnaces Website Printout Believed to have been first published on Jun. 4, 2002, 2 Pages.
NASA Website Unknown NASA SBIR Successes p. 1.
Using Inkjet Technology to Cool Computer Chips, Aug. 13, 2002, www.hpl.hp.com
ews/2002/apr-jun/cooling.html pp. 1-7.
Thermal Challenges During Microprocessor Testing Jun. 2001, Pooya Tadayon, pp. 1-8.
Thermal Management of Multichip Modules with Evaporative Spray Cooling, 1999, Greg Pautsch and Avram Bar-Cohen, EEP-vol. 26-2.
Temperature Control During Test and Burn-In, David Gardell.
Thermal Aspects of Burn-In for High-Power Semiconductor Devices, 2002, Harold E. Hamilton, Micor Control Company.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor burn-in thermal management system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor burn-in thermal management system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor burn-in thermal management system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3507888

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.