Semiconductor array and switches formed on a common substrate fo

Details Semiconductor array and switches formed on a common substrate fo Semiconductor array and switches formed on a common substrate fo

1995-09-05

1998-05-12

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3100, G01R 3126

Patent

active

057511594

ABSTRACT:
A high resolution device array with optical probe and method of probing the array is disclosed, including providing on the array substrate an externally activated switch for each row and each column in the array. The switches are connected together into a row circuit and a column circuit on the substrate. The complete array is probed by connecting an external power circuit to the row and column circuits and, using external light sources, such as lasers, to address and activate each device in the array.

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patent: 5546013 (1996-08-01), Ichioka et al.

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