Semiconductor apparatus, manufacturing method for the...

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks

Reexamination Certificate

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C250S492200, C257SE31127, C438S065000

Reexamination Certificate

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08049344

ABSTRACT:
A semiconductor apparatus according to the present invention includes one or a plurality of pairs of a standard pattern and an offset pattern formed therein with respect to the standard pattern as manufacturing information and other information at an information writing position, which is visible from the outside, of each semiconductor chip on a wafer.

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Office Action dated Jun. 30, 2010 for Japanese Patent Application No. 2008-046854 with a brief summary translation.

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