Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-18
2006-04-18
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S762010
Reexamination Certificate
active
07030639
ABSTRACT:
A semiconductor apparatus includes serially-connected bodies composed of a switch element and a resistance element respectively interposed between terminals adjacent to one another, conduction-test terminals connected to one and another ends of a series of the serially-connected bodies, and a switch control terminal for collectively controlling all the plural switch elements. Also included are switch elements interposed alternately on the first semiconductor chip side and the second semiconductor chip side between wires adjacent to one another, conduction-test terminals connected to one and another ends of a series of the serially-connected switch elements, and a switch control terminal for collectively controlling all the plural switch elements.
REFERENCES:
patent: 4215309 (1980-07-01), Frey
patent: 4749947 (1988-06-01), Gheewala
patent: 5818251 (1998-10-01), Intrater
patent: 6703682 (2004-03-01), Aswell
patent: 2001/0025993 (2001-10-01), Inoue et al.
patent: 4-152277 (1992-05-01), None
Kotani Hisakazu
Shishido Katsuhiko
Ueminami Masahiro
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Tang Minh N.
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