Image analysis – Applications – Personnel identification
Reexamination Certificate
2006-04-18
2006-04-18
Ahmed, Samir (Department: 2623)
Image analysis
Applications
Personnel identification
Reexamination Certificate
active
07031500
ABSTRACT:
A semiconductor apparatus, which comprises: a substrate having a transistor; a first electrode formed on the substrate and connected to the transistor; a second electrode formed on the substrate and electrically separated from the first electrode; and an insulating film formed on the substrate so as to cover the first electrode, wherein, when a plane of the insulating film which is not on a side of the substrate is taken as a first plane, a surface facing the first plane of the first electrode is taken as a first surface, and a surface facing the first plane of the second electrode is taken as a second surface, a distance between a surface of the substrate and the second surface is larger than a distance between the surface of the substrate and the first surface. By virtue of having the above unique structure, the semiconductor apparatus of the present invention is advantageous in that, when a finger or any other material which is electrostatically charged is brought closer to the substrate, the static electricity is not discharged into the electrode but into the static-electricity drawing wiring and then drawn out of the semiconductor device, so that the semiconductor devices, the circuits and the like which are connected to the electrode can be prevented from suffering a damage due to the static electricity and from losing the functions thereof.
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Inglis D. et al: “SA 17.7:A Robust, 1.8V 250MUW Direct-Contact 500DPI Fingerprint Sensor” IEEE Inc. New york, US, 1998, pp. 284-285, XP000856844.
Ahmed Samir
Depke Robert J.
Sony Corporation
Trexler, Bushnell, Giangiorgi, Blackstone & Marr
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