Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1987-09-17
1989-05-16
Chapman, John
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
73517R, 73651, 338 5, G01P 1512
Patent
active
048298220
ABSTRACT:
A semiconductor accelerometer includes a package containing damping liquid. A base is fixedly disposed within the package. A semiconductor plate is disposed within the package and is supported on the base. The semiconductor plate has a movable free end and a deformable diaphragm. A semiconductor strain gauge is associated with the diaphragm and deforms in accordance with deformation of the diaphragm. The base has a first surface opposing the semiconductor plate free end. The first surface of the base has a recess for limiting movement of the semiconductor plate free end. The recess extends to and opens at a second surface of the base which differs from the first surface.
REFERENCES:
patent: 3089343 (1963-05-01), Rule
patent: 3557628 (1971-01-01), Tsukada
patent: 3884085 (1975-05-01), Beckman et al.
patent: 4164263 (1979-08-01), Heintz et al.
patent: 4275586 (1981-06-01), Gast et al.
"A Batch-Fabricated Silicon Accelerometer" by Lynn Michelle Roylance et al., IEEE Transactions on Electron Devices, vol. ED-26, No. 12, Dec. 1979, pp. 1911-1917.
Imai Masahito
Mizuno Tiaki
Shioya Hirohito
Yamada Toshitaka
Chapman John
Nippondenso Co. Ltd.
LandOfFree
Semiconductor accelerometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor accelerometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor accelerometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2313629