Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1997-10-14
1999-10-05
Oda, Christine K.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
7351436, 200 6153, G01P 1508
Patent
active
059627891
ABSTRACT:
A semiconductor acceleration sensor comprising a rectangular semiconductor substrate on the moving electrode side and a rectangular semiconductor substrate on the fixed electrode side laminated on each other, the moving electrode side substrate being formed with a heavy weight and a thin cantilever, a moving electrode being provided on the heavy weight, a first electrostatic attraction electrode being provided on the cantilever, the fixed electrode side substrate being formed with a fixed electrode at a position opposed to the moving electrode and a second electrostatic attraction electrode at a position opposed to the electrostatic attraction electrode. The first and second electrostatic attraction electrodes are placed facing each other. A predetermined spacing is provided between the electrostatic attraction electrodes and a predetermined voltage is applied therebetween.
REFERENCES:
patent: 5596194 (1997-01-01), Kubena
patent: 5744717 (1998-04-01), Tanten
patent: 5756895 (1998-05-01), Kubena
Kunimi Takashi
Matsunaga Tadao
Mori Masatomo
Nezu Masahiro
Akebono Brake Industry Co. Ltd.
Oda Christine K.
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