Measuring and testing – Instrument proving or calibrating – Speed – velocity – or acceleration
Reexamination Certificate
2007-01-16
2007-01-16
Noland, Thomas P. (Department: 2856)
Measuring and testing
Instrument proving or calibrating
Speed, velocity, or acceleration
C324S765010
Reexamination Certificate
active
10868905
ABSTRACT:
Electrical characteristics of a semiconductor acceleration sensor containing a switched capacitor filter (15) are tested while the semiconductor acceleration sensor (1, 30, 50, 70, 90) is vibrated to apply a predetermined acceleration to the semiconductor acceleration sensor (1, 30, 50, 70, 90). The vibration frequency is fixed to a low frequency (for example, 50 Hz) at which the acceleration can be stably applied, and the characteristic of LPF is varied to plural kinds by a signal from an external testing apparatus (2, 40, 60, 80, 95). A sensor signal is received under each of the plural filter characteristics, and if these are within a predetermined specific range, the semiconductor acceleration sensor (1, 30, 50, 70, 90) is judged to be normal.
REFERENCES:
patent: 4283952 (1981-08-01), Newman
patent: 4620446 (1986-11-01), Jensen et al.
patent: 5070843 (1991-12-01), Komurasaki
patent: 5827967 (1998-10-01), Ueyanagi et al.
patent: 5866796 (1999-02-01), Chia et al.
patent: 5895858 (1999-04-01), Malone et al.
patent: 6483322 (2002-11-01), Aoyama et al.
patent: 6859700 (2005-02-01), Bolzmann et al.
patent: 6894482 (2005-05-01), Okada
patent: 7042228 (2006-05-01), Lally et al.
patent: 7086270 (2006-08-01), Weinberg et al.
patent: A-60-119474 (1985-06-01), None
patent: A-08-310339 (1996-11-01), None
patent: A-10-232246 (1998-09-01), None
patent: A-11-2643 (1999-01-01), None
patent: A-11-271357 (1999-10-01), None
Office Action from Japanese Patent Office issued on Jun. 27, 2006 for the corresponding Japanese patent application No. 2003-178152.
Office Action mailed on Oct. 10, 2006 issued from Japanese Patent Office for counterpart application No. 2003-178152. 2 pages in Japanese + 1 page translation.
Denso Corporation
Noland Thomas P.
Posz Law Group , PLC
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