Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1996-07-15
1997-12-02
Chapman, John E.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
G01P 1512
Patent
active
056938845
ABSTRACT:
A semiconductor acceleration sensor includes a substrate, a semiconductor sensor chip with a diaphragm and having one end fixed to a pedestal, the pedestal including at least one thick film layer and disposed on the substrate, and a protrusion of at least one thick film layer on the substrate directly opposite a free end of the sensor chip, shorter than the pedestal. The protrusion protects the semiconductor sensor chip from breakage at the diaphragm due to impacts.
REFERENCES:
patent: 4825696 (1989-05-01), Seipler
patent: 5351542 (1994-10-01), Ichimura et al.
Chapman John E.
Mitsubishi Denki & Kabushiki Kaisha
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