Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1997-02-07
2000-12-12
Moller, Richard A.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
G01P 1512
Patent
active
061582832
ABSTRACT:
A semiconductor acceleration sensor comprises a cantilever structure formed from a semiconductor wafer and having a first surface for receiving an acceleration force, a second surface disposed generally orthogonal to the first surface, and strain sensing portions disposed on the second surface. A supporting body supports the cantilever structure. A plurality of bridge circuits are disposed on the second surface of the rectangular parallelepiped shaped structure. Each of the bridge circuits has a plurality of the strain sensing portions.
REFERENCES:
patent: 3965453 (1976-06-01), Seidel et al.
patent: 4688434 (1987-08-01), Cherbuy
patent: 4969359 (1990-11-01), Mikkor
patent: 5081867 (1992-01-01), Yamada
patent: 5170665 (1992-12-01), Janiaud et al.
patent: 5415044 (1995-05-01), Yamamoto
patent: 5606128 (1997-02-01), Araki
patent: 6005275 (1999-12-01), Shinogi et al.
Kato Kenji
Saitoh Yutaka
Shinogi Masataka
Moller Richard A.
Seiko Instruments R&D Center Inc.
LandOfFree
Semiconductor acceleration sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor acceleration sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor acceleration sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-206121