Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1995-12-26
1997-02-25
Williams, Hezron E.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
7351433, 73 1D, G01P 1512, G01P 1509
Patent
active
056061285
ABSTRACT:
A semiconductor acceleration detecting device provided with a pedestal electrically and mechanically connected to an electrode mounted on a base with an electrically conductive adhesive, a semiconductor chip electrically and mechanically connected to the pedestal with an electrically conductive adhesive like a cantilever, and a strain gauge for detecting deformation of the semiconductor chip due to an applied acceleration. Current used for detecting detachment flows from the electrode into a wire connected to a grounding terminal through the pedestal and the semiconductor chip. Moreover, a detachment between the base and the pedestal or between the pedestal and the semiconductor chip is sensed by detecting whether the current flows normally. Thereby, erroneous acceleration of the object can be prevented from being measured.
REFERENCES:
patent: 5415044 (1995-05-01), Yamamoto
patent: 5460044 (1995-10-01), Yamamoto
patent: 5499526 (1996-03-01), Muro
Kwok Helen C.
Mitsubishi Denki & Kabushiki Kaisha
Williams Hezron E.
LandOfFree
Semiconductor acceleration detecting device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor acceleration detecting device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor acceleration detecting device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1975527