Measuring and testing – Instrument proving or calibrating – Volume of flow – speed of flow – volume rate of flow – or mass...
Patent
1995-07-26
1997-03-18
Chapman, John E.
Measuring and testing
Instrument proving or calibrating
Volume of flow, speed of flow, volume rate of flow, or mass...
G01P 2100
Patent
active
056124880
ABSTRACT:
A semiconductor acceleration system for detecting acceleration by outputting an electrical signal includes a diagnostic circuit for detecting failures in an output amplifier of the system. The system includes strain gauge resistors on a semiconductor substrate and connected in a bridge circuit. The output terminals of the bridge circuit are connected to an output amplifier. The diagnostic circuit includes two constant current sources producing different constant current flows and respectively connected to the two output terminals of the bridge circuit. When a switch is closed connecting the constant current sources to ground so that the constant currents flow through two of the strain gauge resistors, the output signal of the amplifier is observed. The output signal with the switch open and closed discloses the existence of a fault in the output amplifier circuit and the location of that fault.
REFERENCES:
patent: 5499526 (1996-03-01), Muro
M. Motoh et al., "Toyota Air Bag Sensor," in Isata, No. 911270, 1991, pp. 89-96.
Araki Toru
Yamamoto Masahiro
Chapman John E.
Mitsubishi Denki & Kabushiki Kaisha
LandOfFree
Semiconductor acceleration detecting device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor acceleration detecting device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor acceleration detecting device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1707501