Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1993-12-22
1995-10-24
Chilcot, Jr., Richard E.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
73 1D, G01P 1509
Patent
active
054600448
ABSTRACT:
In a semiconductor acceleration detecting apparatus, an amplification circuit is provided on a movable portion of an acceleration detecting beam, not on a fixed portion thereof, and the size of the fixed portion and the circuit area thereon are thus reduced. A damage detecting circuit is mounted on the fixed portion to detect breakage of the acceleration detecting beam and damage to various circuits, and a damage detecting interconnection is disposed along a peripheral edge of the movable portion, across a diaphragm and across an outer peripheral edge of the movable portion. Consequently, the size of the acceleration detecting beam can be reduced without changing the size of the movable portion i.e., without changing the characteristics of the apparatus, thus reducing the entire size of the semiconductor acceleration detecting apparatus.
REFERENCES:
patent: 4829822 (1989-05-01), Imai et al.
patent: 5060504 (1991-10-01), White et al.
patent: 5343731 (1994-09-01), Miyano
patent: 5351542 (1994-10-01), Ichimura et al.
Chilcot Jr. Richard E.
Mitsubishi Denki & Kabushiki Kaisha
Noori Max H.
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