Semiconductive polymeric system, devices incorporating the...

Electrolysis: processes – compositions used therein – and methods – Electrolytic material treatment – Metal or metal alloy

Reexamination Certificate

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C205S731000, C205S734000, C205S735000, C205S740000, C204S196120, C204S196160, C204S196370

Reexamination Certificate

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06890420

ABSTRACT:
A semiconductor system is provided that uses semiconductive organic polymers, electronics and semiconductor technology to provide a wide array of semiconductor components and a system of preventing corrosion of a surface of a metal structure in contact with a corrosive environment involving:(a) a semiconductive organic polymer coating in conductive contact with at least part of the surface; and(b) an electronic filter for filtering corrosive noise and a method of preventing corrosion using the system.

REFERENCES:
patent: 3562124 (1971-02-01), Leon et al.
patent: 3574801 (1971-04-01), Jauker
patent: 3620784 (1971-11-01), Schutt
patent: 3864234 (1975-02-01), Watson
patent: 4010759 (1977-03-01), Boer
patent: 4219358 (1980-08-01), Hayashi et al.
patent: 4381981 (1983-05-01), Maes
patent: 4836768 (1989-06-01), Wilson et al.
patent: 4863578 (1989-09-01), Webster
patent: 4957612 (1990-09-01), Stewart et al.
patent: 5009757 (1991-04-01), Riffe et al.
patent: 5352342 (1994-10-01), Riffe
patent: 5425867 (1995-06-01), Dawson et al.
patent: 5478451 (1995-12-01), Riffe
patent: 5500629 (1996-03-01), Meyer
patent: 5868920 (1999-02-01), Nylund et al.
patent: 5888374 (1999-03-01), Pope et al.
patent: 6325915 (2001-12-01), Dowling et al.
patent: 6402933 (2002-06-01), Dowling
patent: 6551491 (2003-04-01), Dowling et al.
patent: 6562201 (2003-05-01), Dowling
patent: WO 0143173 (2001-06-01), None
K. Hladky, et al., “The Measurement of Localized Corrosion Using Electrochemical Noise”, Corrosion and Protection Centre, LIMIST, Manchester, England, pp. 1-7, www.khdesign.demon.co.uk
oise/paper1.htm.
“Electrochemical Noise Based Waste Tank Corrosion Monitoring”, from Electrochemical Noise Based Corrosion Probe Overview, pp. 1-2, www.hanford.gov/twrs/corrosion/ecn.htm.
“Electrochemical Noise Measurement System” from Non-Destructive Monitoring of Corrosion by Electrochemical Noise Measurement, 3 pp.
Technical Basis for Electrochemical Noise Based Corrosion Monitoring, 22 pp.
Chad A. Mirkin, et al., “Semiconductors meed biology”, NATURE, vol. 405, Jun. 2000, 4 pp.
Marc W. Mittelman, “Recovery and Characterization of Biofilm Bacteria Associated with Medical Devices”, Methods in Enzymology, vol. 310, 1999, pp. 534-551, no month available.
B.R. McLeod, et al., “Enhanced Bacterial Biofilm control Using Electromagnetic Fields in Combination with Antibiotics”, Methods in Enzymology, vol. 310, 1999, pp. 656-670, no month available.
David R. Clarke, et al., “Varistor Ceramics”, J. Am. Ceram. Soc., vol. 82, No. 3, pp. 485-502, 1999, no month available.
Kirk-Othmer Encyclopedia of Chemical Technology, 4thEd., vol., 9, pp. 61-85 (1994), no month available.
Kirk-Othmer Encyclopedia of Chemical Technology, 4thEd., vol. 21, pp. 720-816 (1994), no month available.

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