Chemistry of inorganic compounds – Silicon or compound thereof – Oxygen containing
Reexamination Certificate
2008-01-15
2008-01-15
Hiteshew, Felisa (Department: 1722)
Chemistry of inorganic compounds
Silicon or compound thereof
Oxygen containing
C117S017000, C117S018000
Reexamination Certificate
active
07318916
ABSTRACT:
A semiconductive GaAs wafer has a diameter of 4 inches or more, and an in-wafer plane dislocation density of 30,000/cm2or more and 100,000/cm2or less. A semiconductive GaAs wafer is made by growing a GaAs single crystal under a temperature gradient of 20° C./cm or more and 150° C./cm or less formed in the crystal so that the semiconductive GaAs wafer has an in-wafer plane dislocation density of 30,000/cm2or more and 100,000/cm2or less.
REFERENCES:
patent: 6866714 (2005-03-01), Kawase et al.
patent: 11-268997 (1999-10-01), None
Daihou Kouji
Wachi Michinori
Yabuki Shinji
Hitachi Cable Ltd.
Hiteshew Felisa
McGinn IP Law Group PLLC
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