Semi-conductor component testing process and system for...

Details Semi-conductor component testing process and system for... Semi-conductor component testing process and system for...

2007-06-12

2007-06-12

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S759030, C324S764010, C324S1540PB

Reexamination Certificate

active

10860594

ABSTRACT:
The invention involves a semi-conductor component testing process, and a system for testing semi-conductor components, in which a central computer device, in particular a central test apparatus is provided, with which test result data obtained from at least two separate tests is jointly evaluated, in particular by means of an appropriate pattern recognition process, which incorporates the test result data obtained from the separate tests into the analysis.

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