Semi-conductor component test process and a system for...

Details Semi-conductor component test process and a system for... Semi-conductor component test process and a system for...

2007-09-04

2007-09-04

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S759030, C324S764010, C324S1540PB

Reexamination Certificate

active

10874761

ABSTRACT:
A semi-conductor component test process, and a system for testing semi-conductor components, with which several different semi-conductor-component tests can be conducted in succession. A computer installation, in particular a test apparatus is provided, with which test result data obtained from a first test is evaluated, and which causes a further test provided after the first test), to be performed in an amended fashion, or to be dispensed with, depending on the test result data obtained from the first test.

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patent: 1 273 923 (2001-07-01), None

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