SEM test apparatus

Electricity: measuring and testing – Particle precession resonance – Using an electron resonance spectrometer system

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S309000, C315S039510, C315S039770

Reexamination Certificate

active

07436177

ABSTRACT:
Test apparatus for examining the operation and functioning of ultra-small resonant structures, and specifically using an SEM as the testing device and its electron beam as an exciting source of charged particles to cause the ultra-small resonant structures to resonate and produce EMR.

REFERENCES:
patent: 1948384 (1934-02-01), Lawrence
patent: 2307086 (1943-01-01), Varian et al.
patent: 2431396 (1947-11-01), Hansell
patent: 2473477 (1949-06-01), Smith
patent: 2634372 (1953-04-01), Salisbury
patent: 2932798 (1960-04-01), Kerst et al.
patent: 3571642 (1971-03-01), Westcott
patent: 3761828 (1973-09-01), Pollard et al.
patent: 3923568 (1975-12-01), Bersin
patent: 3989347 (1976-11-01), Eschler
patent: 4282436 (1981-08-01), Kapetanakos
patent: 4482779 (1984-11-01), Anderson
patent: 4727550 (1988-02-01), Chang et al.
patent: 4740973 (1988-04-01), Madey
patent: 4746201 (1988-05-01), Gould
patent: 4829527 (1989-05-01), Wortman et al.
patent: 4838021 (1989-06-01), Beattie
patent: 5023563 (1991-06-01), Harvey et al.
patent: 5157000 (1992-10-01), Elkind et al.
patent: 5163118 (1992-11-01), Lorenzo et al.
patent: 5185073 (1993-02-01), Bindra
patent: 5199918 (1993-04-01), Kumar
patent: 5262656 (1993-11-01), Blondeau et al.
patent: 5263043 (1993-11-01), Walsh
patent: 5268693 (1993-12-01), Walsh
patent: 5268788 (1993-12-01), Fox et al.
patent: 5302240 (1994-04-01), Hori et al.
patent: 5354709 (1994-10-01), Lorenzo et al.
patent: 5446814 (1995-08-01), Kuo et al.
patent: 5608263 (1997-03-01), Drayton et al.
patent: 5668368 (1997-09-01), Sakai et al.
patent: 5705443 (1998-01-01), Stauf et al.
patent: 5737458 (1998-04-01), Wojnarowski et al.
patent: 5744919 (1998-04-01), Mishin et al.
patent: 5757009 (1998-05-01), Walstrom
patent: 5767013 (1998-06-01), Park
patent: 5790585 (1998-08-01), Walsh
patent: 5811943 (1998-09-01), Mishin et al.
patent: 5821836 (1998-10-01), Katehi et al.
patent: 5821902 (1998-10-01), Keen
patent: 5831270 (1998-11-01), Nakasuji
patent: 5847745 (1998-12-01), Shimizu et al.
patent: 5889449 (1999-03-01), Fiedziuszko
patent: 5902489 (1999-05-01), Yasuda et al.
patent: 6008496 (1999-12-01), Winefordner et al.
patent: 6040625 (2000-03-01), Ip
patent: 6060833 (2000-05-01), Velazco
patent: 6080529 (2000-06-01), Ye et al.
patent: 6195199 (2001-02-01), Yamada
patent: 6222866 (2001-04-01), Seko
patent: 6281769 (2001-08-01), Fiedziuszko
patent: 6297511 (2001-10-01), Syllaios et al.
patent: 6338968 (2002-01-01), Hefti
patent: 6370306 (2002-04-01), Sato et al.
patent: 6373194 (2002-04-01), Small
patent: 6376258 (2002-04-01), Hefti
patent: 6407516 (2002-06-01), Victor
patent: 6441298 (2002-08-01), Thio
patent: 6504303 (2003-01-01), Small
patent: 6545425 (2003-04-01), Victor
patent: 6577040 (2003-06-01), Nguyen
patent: 6603915 (2003-08-01), Glebov et al.
patent: 6624916 (2003-09-01), Green et al.
patent: 6636653 (2003-10-01), Miracky et al.
patent: 6642907 (2003-11-01), Hamada et al.
patent: 6738176 (2004-05-01), Rabinowitz et al.
patent: 6741781 (2004-05-01), Furuyama
patent: 6782205 (2004-08-01), Trisnadi et al.
patent: 6791438 (2004-09-01), Takahashi et al.
patent: 6829286 (2004-12-01), Guilfoyle et al.
patent: 6834152 (2004-12-01), Gunn et al.
patent: 6870438 (2005-03-01), Shino et al.
patent: 6885262 (2005-04-01), Nishimura et al.
patent: 6909092 (2005-06-01), Nagahama
patent: 6909104 (2005-06-01), Koops
patent: 6944369 (2005-09-01), Deliwala
patent: 6953291 (2005-10-01), Liu
patent: 6965625 (2005-11-01), Mross et al.
patent: 6995406 (2006-02-01), Tojo et al.
patent: 7010183 (2006-03-01), Estes et al.
patent: 7092588 (2006-08-01), Kondo
patent: 7092603 (2006-08-01), Glebov et al.
patent: 7122978 (2006-10-01), Nakanishi et al.
patent: 7177515 (2007-02-01), Estes et al.
patent: 7267459 (2007-09-01), Matheson
patent: 7267461 (2007-09-01), Kan et al.
patent: 2001/0025925 (2001-10-01), Abe et al.
patent: 2002/0009723 (2002-01-01), Hefti
patent: 2002/0027481 (2002-03-01), Fiedziuszko
patent: 2002/0036264 (2002-03-01), Nakasuji et al.
patent: 2002/0053638 (2002-05-01), Winkler et al.
patent: 2002/0135665 (2002-09-01), Gardner
patent: 2003/0012925 (2003-01-01), Gorrell
patent: 2003/0016412 (2003-01-01), Small
patent: 2003/0016421 (2003-01-01), Small
patent: 2003/0034535 (2003-02-01), Barenburu et al.
patent: 2003/0155521 (2003-08-01), Feuerbaum
patent: 2003/0164947 (2003-09-01), Vaupel
patent: 2003/0179974 (2003-09-01), Estes et al.
patent: 2003/0206708 (2003-11-01), Estes et al.
patent: 2003/0214695 (2003-11-01), Abramson et al.
patent: 2004/0061053 (2004-04-01), Taniguchi et al.
patent: 2004/0108473 (2004-06-01), Melnychuk et al.
patent: 2004/0136715 (2004-07-01), Kondo
patent: 2004/0150991 (2004-08-01), Ouderkirk et al.
patent: 2004/0171272 (2004-09-01), Jin et al.
patent: 2004/0180244 (2004-09-01), Tour et al.
patent: 2004/0213375 (2004-10-01), Bjorkholm et al.
patent: 2004/0217297 (2004-11-01), Moses et al.
patent: 2004/0231996 (2004-11-01), Webb
patent: 2004/0240035 (2004-12-01), Zhilkov
patent: 2004/0264867 (2004-12-01), Kondo
patent: 2005/0023145 (2005-02-01), Cohen et al.
patent: 2005/0045821 (2005-03-01), Noji et al.
patent: 2005/0054151 (2005-03-01), Lowther et al.
patent: 2005/0067286 (2005-03-01), Ahn et al.
patent: 2005/0082469 (2005-04-01), Carlo
patent: 2005/0092929 (2005-05-01), Schneiker
patent: 2005/0105690 (2005-05-01), Pau et al.
patent: 2005/0145882 (2005-07-01), Taylor et al.
patent: 2005/0162104 (2005-07-01), Victor et al.
patent: 2005/0190637 (2005-09-01), Ichimura et al.
patent: 2005/0194258 (2005-09-01), Cohen et al.
patent: 2005/0201707 (2005-09-01), Glebov et al.
patent: 2005/0201717 (2005-09-01), Matsumura et al.
patent: 2005/0212503 (2005-09-01), Deibele
patent: 2005/0249451 (2005-11-01), Baehr-Jones et al.
patent: 2006/0007730 (2006-01-01), Nakamura et al.
patent: 2006/0018619 (2006-01-01), Helffrich et al.
patent: 2006/0035173 (2006-02-01), Davidson et al.
patent: 2006/0045418 (2006-03-01), Cho et al.
patent: 2006/0060782 (2006-03-01), Khursheed
patent: 2006/0062258 (2006-03-01), Brau et al.
patent: 2006/0159131 (2006-07-01), Liu et al.
patent: 2006/0164496 (2006-07-01), Tokutake et al.
patent: 2006/0208667 (2006-09-01), Lys et al.
patent: 2006/0216940 (2006-09-01), Gorrell et al.
patent: 2006/0243925 (2006-11-01), Barker et al.
patent: 2006/0274922 (2006-12-01), Ragsdale
patent: 2007/0003781 (2007-01-01), de Rochemont
patent: 2007/0013765 (2007-01-01), Hudson et al.
patent: 2007/0075264 (2007-04-01), Gorrell et al.
patent: 2007/0086915 (2007-04-01), LeBoeuf et al.
patent: 2007/0116420 (2007-05-01), Estes et al.
patent: 0237559 (1991-12-01), None
patent: 2004-32323 (2004-01-01), None
patent: WO 87/01873 (1987-03-01), None
patent: WO 93/21663 (1993-10-01), None
patent: WO 00/72413 (2000-11-01), None
patent: WO 02/25785 (2002-03-01), None
patent: WO 02/077607 (2002-10-01), None
patent: WO 2004/086560 (2004-10-01), None
patent: WO 2005/015143 (2005-02-01), None
patent: WO 2006/042239 (2006-04-01), None
patent: WO 2007/081389 (2007-07-01), None
patent: WO 2007/081390 (2007-07-01), None
patent: WO 2007/081391 (2007-07-01), None
J. C. Palais, “Fiber optic communications,” Prentice Hall, New Jersey, 1998, pp. 156-158.
Search Report and Written Opinion mailed Dec. 20, 2007 in PCT Appln. No. PCT/US2006/022771.
Search Report and Written Opinion mailed Jan. 31, 2008 in PCT Appln. No. PCT/US2006/027427.
Search Report and Written Opinion mailed Jan. 8, 2008 in PCT Appln. No. PCT/US2006/028741.
Search Report and Written Opinion mailed Mar. 11, 2008 in PCT Appln. No. PCT/US2006/022679.
U.S. Appl. No. 11/418,082, filed May 5, 2006, Gorrell et al.
Lee Kwang-Cheol et al., “Deep X-Ray Mask with Integrated Actuator for 3D Microfabrication”, Conference: Pacific Rim Workshop on Transducers and Micro/Nano Technologies, (Xiamen CHN), Jul. 22, 2002.
Markoff, John, “A Chip That Can Transfer Data Using Laser Light,” The New York Times, Sep. 18, 2006.
S.M. Sze, “Semiconductor Devices Physics and Technology”, 2nd Edition, Chapters 9 and 12, Copyright 1985, 2002.
Search Report and Written Opinion mailed Feb. 12, 2007 in PCT Appln. No

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

SEM test apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with SEM test apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SEM test apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4012991

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.