Self-timed reliability and yield vehicle array

Details Self-timed reliability and yield vehicle array Self-timed reliability and yield vehicle array

2005-03-01

2005-03-01

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06861864

ABSTRACT:
A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. An interconnect module designed at many of the manufacturing process limits offers complete and fast failure analysis so that manufacturing defects can be quickly located and the process improved. Failure analysis, particularly on 90 nm technologies and beyond is becoming extremely difficult. At-speed testing is also becoming very important to the yield and reliability of products. This invention incorporates a self-timed speed circuit that can detect subtle resistive faults and also show the exact location in the array where the speed fault occurred based on test program datalogs from scan flip flops.

REFERENCES:
patent: 5299204 (1994-03-01), Daniel
patent: 5674651 (1997-10-01), Nishi
patent: 6092223 (2000-07-01), Ahn
patent: 6436741 (2002-08-01), Sato et al.
patent: 6483176 (2002-11-01), Noguchi et al.
patent: 6707064 (2004-03-01), Jang et al.

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