Induced nuclear reactions: processes – systems – and elements – Testing – sensing – measuring – or detecting a fission reactor... – Vessel monitoring or inspection
Patent
1993-10-22
1995-10-03
Hudspeth, David R.
Induced nuclear reactions: processes, systems, and elements
Testing, sensing, measuring, or detecting a fission reactor...
Vessel monitoring or inspection
326 86, H03K 1704
Patent
active
054555213
ABSTRACT:
A circuit style, which may be employed in fast, area-efficient, flexible programmable interconnect architectures, or in logic circuits, is disclosed. In one embodiment, a plurality of internally delayed logic circuits, each having a single network node, is connected to the intermediate nodes of a programmable interconnect architecture. Each speed-up circuit monitors the logic level on the network node. When a circuit detects a substantial change in logic level, it temporarily enforces that change by connecting its network node to either the high or the low logic level. Thus, on each node, a low-impedance enhancement of the signal driving the node temporarily appears. This causes the potential on neighboring nodes, connected through conducting programmable switches, to change towards the new level, and their speed-up circuits in turn temporarily enforce the new level. Thus, a forced high-to-low or low-to-high level change on a node quickly propagates to its connected nodes.
REFERENCES:
patent: 4446382 (1984-05-01), Moore et al.
patent: 4498021 (1985-02-01), Uya
patent: 4598216 (1986-07-01), Lauffer et al.
patent: 4621202 (1986-11-01), Pumo
patent: 4763023 (1988-08-01), Spence
patent: 4829199 (1989-05-01), Prater
patent: 5202593 (1993-04-01), Huang et al.
Glasser, L. A., and Dobberpuhl, D. W., The Design and Analysis of VLSI Circuits, c. 1985, Addison-Wesley, Reading, Mass., pp. 419-420.
Ogura, T., et al., "A 20-kbit Associate Memory LSI for Artificial Intelligence Machines", IEEE Journal of Solid State Circuits, V. 24, No. 4, Aug. 4, 1989, p. 1018.
Hudspeth David R.
The Board of Trustees of the Leland Stanford Junior University
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