Self-testing monitoring circuit

Induced nuclear reactions: processes – systems – and elements – Testing – sensing – measuring – or detecting a fission reactor... – By particular instrumentation circuitry

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Details

376215, 324158R, 324 73R, 340644, G21C 736, G01R 3100, G08B 1900

Patent

active

047626631

ABSTRACT:
A self-testing contact closure test circuit and method in which invalid logic states are artificially created in order to simulate a switch malfunction, and thus to determine whether the testing circuitry correctly identifies the invalid state. The system is designed to be used with switches such as those incorporating form "C" arrangements having two pairs of contacts which under normal circumstances are in opposite states.

REFERENCES:
patent: 4516076 (1985-05-01), Pillari et al.
patent: 4583013 (1986-04-01), Gupta
patent: 4664870 (1987-05-01), Hager
patent: 4692298 (1987-09-01), Coradi et al.

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