Self-testing input/output pad

Details Self-testing input/output pad Self-testing input/output pad

2005-11-08

2005-11-08

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

06963212

ABSTRACT:
The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled to a first contact site on a semiconductor chip. A subordinate driving circuit also has an output coupled to the first contact site on the semiconductor chip. A test control circuit sets a drive fight up between the dominant and subordinate driving circuits, the test control circuit selecting a stronger drive strength for the dominant driving circuit than for the subordinate driving circuit. The drive fight produces a test value at the first contact site. The test value from the first contact site is transferred to a second contact site on the semiconductor chip to be probed by an external prober.

REFERENCES:
patent: 5796260 (1998-08-01), Agan
patent: 6586921 (2003-07-01), Sunter
patent: 6658613 (2003-12-01), Rearick et al.
patent: 6762614 (2004-07-01), Rearick et al.
patent: 6859059 (2005-02-01), Rohrbaugh et al.

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