Self test circuit for evaluating a high-speed serial interface

Details Self test circuit for evaluating a high-speed serial interface Self test circuit for evaluating a high-speed serial interface

2005-12-20

2005-12-20

Liu, Shuwang (Department: 2634)

Pulse or digital communications

Testing

C375S221000, C375S213000, C375S220000, C714S733000, C714S724000, C714S704000

Reexamination Certificate

active

06977960

ABSTRACT:
A data transceiver including a self-test data generator for generating test data, which includes a first pseudo-random number generator programmable so as to allow the operator to input the test data values. The data transceiver further includes a transmitter section coupled to the self-test data generator, a receiver section coupled to the transmitter section, and a test data analyzer coupled to the receiver section, wherein the test data analyzer includes a second pseudo-random number generator, which allows the operator to input the data value via a data bus coupled to the test data analyzer. Both the self-test data generator and the test data analyzer are independently controllable.

REFERENCES:
patent: 5802073 (1998-09-01), Platt
patent: 6201829 (2001-03-01), Schneider
patent: 6298458 (2001-10-01), Cranford et al.
patent: 6760873 (2004-07-01), Hao et al.
patent: 6816987 (2004-11-01), Olson et al.
patent: 2004/0153931 (2004-08-01), Cao et al.

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