Measuring and testing – Instrument proving or calibrating – Speed – velocity – or acceleration
Reexamination Certificate
2005-07-19
2005-07-19
Noland, Thomas P. (Department: 2856)
Measuring and testing
Instrument proving or calibrating
Speed, velocity, or acceleration
C073S001880, C324S601000, C029S592000, C702S116000
Reexamination Certificate
active
06918282
ABSTRACT:
A test circuit and method provide testing of a capacitive type microsensor. The method includes applying a first signal having a first voltage potential to an input of a microsensor during a non-test operating mode. The method also includes applying a second voltage signal having a second voltage potential different than the first voltage potential during a test mode. The second voltage potential induces a net differential electrostatic force in the microsensor. The method further includes the steps of monitoring an output signal of the microsensor, comparing the output signal to an expected value when the microsensor is in the test mode, and determining if the microsensor is functioning properly as a function of the comparison.
REFERENCES:
patent: 5506454 (1996-04-01), Hanzawa et al.
patent: 5511007 (1996-04-01), Nihei et al.
patent: 5517431 (1996-05-01), Pattantyus et al.
patent: 5583290 (1996-12-01), Lewis
patent: 6257061 (2001-07-01), Nonoyama et al.
patent: 6257062 (2001-07-01), Rich
patent: 6393914 (2002-05-01), Zarabadi et al.
patent: 6428713 (2002-08-01), Christenson et al.
patent: 6450029 (2002-09-01), Sakai et al.
patent: 6666092 (2003-12-01), Zarabadi et al.
patent: 6718826 (2004-04-01), Zarabadi et al.
patent: 6761070 (2004-07-01), Zarabadi et al.
patent: 2002/0011107 (2002-01-01), Sakai et al.
patent: 2002/0148291 (2002-10-01), Nagahara et al.
patent: 2003/0033847 (2003-02-01), Freehill et al.
patent: 2004/0134256 (2004-07-01), Herrmann et al.
patent: 100 46 958 (2001-03-01), None
Atherton, J H: “Sensor Signal Conditioning—An IC Designer's Perspective” Electro International. Conference Record, New York, NY, USA, Apr. 16-18, 1991, Apr. 16, 1991, pp. 129-134, XP010305348 *p. 133*.
Henry V. Allen et al., Accelerometer Systems With Built-in Testing, 1990, Sensors and Actuators, 381-386, month not given.
Chmielewski Stefan V.
Delphi Technologies Inc.
Noland Thomas P.
LandOfFree
Self-test circuit and method for testing a microsensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Self-test circuit and method for testing a microsensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-test circuit and method for testing a microsensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3414878