Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-04-14
2000-01-11
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356357, G01B 902
Patent
active
060142154
ABSTRACT:
A fiber optic sensor system comprises an optical fiber, a first reflector and a second reflector. The first reflector provides a fixed reference for measuring the optical path length between the second reflector and a reference reflector. The first and second reflectors respectively receive first and second portions of light emitted by the optical fiber and then reflect the light back to the optical fiber. The optical path length between the first and second reflectors varies in accordance with a sensed parameter. In operation, first and second interferograms are acquired that are produced by the interference of light reflected from the first and second reflectors with light reflected from a reference reflector. The first and second interferograms are then used to determine an optical path length between first and second reflectors. Finally, the optical path length between the first and second reflectors is used to determine the value of the sensed parameter.
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Kempen Lothar U.
LieBerman Robert A.
Prohaska John D.
Physical Optics Corporation
Turner Samuel A.
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