Self-light-emitting device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – In combination with or also constituting light responsive...

Reexamination Certificate

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C257S084000, C257S088000, C257S099000, C257S290000, C257S291000

Reexamination Certificate

active

07132693

ABSTRACT:
Failure light emission of an EL element due to failure film formation of an organic EL material in an electrode hole46is improved. By forming the organic EL material after embedding an insulator in an electrode hole46on a pixel electrode and forming a protective portion41b, failure film formation in the electrode hole46can be prevented. This can prevent concentration of electric current due to a short circuit between a cathode and an anode of the EL element, and can prevent failure light emission of an EL layer.

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