Self-induced rotation ellipsometer

Optics: measuring and testing – Refraction testing – Prism engaging specimen

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Details

350147, 356116, G02F 100

Patent

active

041053370

ABSTRACT:
The invention relates to an ellipsometer for measuring the degree of elliptical polarization of a beam of coherent optical radiation. Applications of the invention include a device for measuring birefringence and a material detector for measuring small concentrations of substances in a gaseous medium.

REFERENCES:
patent: 3864020 (1975-02-01), Armstrong et al.
patent: 4040718 (1977-08-01), Bjorklund et al.
Levenson et al., "Raman-Induced Kerr Effect with Elliptical Polarization," J. Opt. Soc. Am., vol. 66, No. 7, Jul. 1976, pp. 641-643.

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