Self-guiding receptacle for a semiconductor test socket

Details Self-guiding receptacle for a semiconductor test socket Self-guiding receptacle for a semiconductor test socket

1993-10-01

1995-04-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

439378, G01R 3102, H01R 1364

Patent

active

054102588

ABSTRACT:
A receptacle for a semiconductor test socket has a body with a substantially planar surface and a plurality of female contact pins extending through the planar surface. Each of the female contact pins has an opening at one end through the planar surface. A protuberance extends from the body for insertion into a matching recess in the test socket for pre-aligning the male contact pins with the respective female contact pins on the receptacle.

REFERENCES:
patent: 1722816 (1929-07-01), Meunier
patent: 3106435 (1963-10-01), Yopp
patent: 3409857 (1968-11-01), O'Neill et al.
patent: 3447036 (1969-05-01), Dore et al.
patent: 3487352 (1969-12-01), Putyato et al.
patent: 4209216 (1980-06-01), Brooks
patent: 4721477 (1988-01-01), Lotter
patent: 4753603 (1988-06-01), Hafstad
patent: 4840574 (1989-06-01), Mills
patent: 4980636 (1990-12-01), Romanofsky et al.
patent: 5032088 (1991-07-01), Kuramitsu
patent: 5067911 (1991-11-01), Saeki
patent: 5125849 (1992-06-01), Briggs et al.
patent: 5208529 (1993-05-01), Tsurishima et al.

Affiliated with

Also associated with

Rating

Self-guiding receptacle for a semiconductor test socket does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-guiding receptacle for a semiconductor test socket, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-guiding receptacle for a semiconductor test socket will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1570234