Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VL

Details Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VL Self diagnostic Cyclic Analysis Testing System (CATS) for LSI/VL

1986-01-30

1987-07-14

Atkinson, Charles E.

Excavating

324 73R, G01R 3128

Patent

active

046807616

ABSTRACT:
A novel self diagnostic Cyclic Analysis Testing System (CATS) for functional testing of integrated circuit boards, and assemblies is disclosed, wherein a logic device under test is isolated and reconfigured to simulate a non-linear binary sequence generator which has known settings during normal fault free operation. The memory elements of the logic under test are preset to a known start setting, and the device is clocked for a given number of steps to define a testing cycle to operate the logic gates and memory elements of the device under test as the non-linear sequence generator. At the end of the testing cycle, the settings of the memory elements are compared with the known settings, and a fault condition is indicated when the setting(s) differ from the known setting.

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